Reliability Evaluation Procedure of Thick Film Inductors Manufactured by Various Techniques
نویسندگان
چکیده
The paper deals with reliability evaluation procedure of thick film inductors manufactured by various techniques. Thick film inductors belong to the specific electronic passive components, which properties are known as a component „tailored“according to the application, structure and construction. Evaluation methodology principle of thick film inductors issues from entities of standardized reliability evaluation procedure of classical electronic equipments. Influence of various factors to the level of quality and reliability of thick film inductors play considerable role according with manufacturing technology. The combination of climatic factors (e.g. temperature, humidity) with manufacturing conditions of thick film inductors influenced the electrical performance of inductors: inductance L, quality factor Q and parasitic parameters: serial resistance Rs and self capacitance Cp. Various reliability test were realized based on the comparison of influence of various climatic factors: accelerated ageing thermal stress test, damp heat test cyclic, dry heat test and thermal shock. This paper shows on manufacturing possibilities of thick film inductors that were manufactured by three various techniques: conventional thick film technology, application of photosensitive paste Fodel and etching in combination with photolitography process.
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